Probe Station (MI-WPT2)
• Optimized for I-V, C-V measurements of device and wafer characterization tests, Failure analysis, sub- micro probing MEMS, optoelectronics engineering test and more.
• Stable Platen mounted with up to 6 micro positioners facility.
• Solid station frame with built-in vibration-isolations.
• Option for High Resolution top side microscope.
• Quick and ergonomic sample change.