Probe Station MI-WPT4A-HT
Probe Station MI-WPT4A-HT - Image 2

Probe Station MI-WPT4A-HT

Mine Probe station (MI-WPT4A-HT) provide precisely controlled variable Temperature environments for non
destructive measurement of the electrical properties of materials & early-stage electronic devices. Probe stations
enable physical scientists & researchers to conduct fundamental science through convenient, repeatable
measurements producing consistent results. Probe stations are versatile & flexible research platforms that can be
used in dedicated applications or as multi-use community research assets.

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Description

Features

  • Back-lash free movement
  • Advanced Microscope with camera
  • Low noise vacuum pump
  • Precise Measurement
  • with 4” Thermal Chuck (Temp. range- room temp. to 200⁰C)
  • Stable Platen mounted with capacity to mount up to 6 Micro-positioners.
  • Solid station frame with built-in vibration-isolations.

Applications

  • (with 4” Thermal Chuck & Advanced Microscope Temp. range- room temp. to 200⁰C)
  • Wafer-level semiconductor device characterization, including I–V & C–V measurements on MOSFET & diodes.
  • Micro-device probing with micro-positioners.
  • Material characterization under Room Temp. to 200⁰C.
  • Failure Analysis & Design Validation/IC Engineering.
  • Device Characterization

 

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